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H. von Bardeleben, Jean-Louis Cantin, A. Parisini, A. Bosio, R. Fornari. Conduction mechanism and shallow donor properties in silicon-doped ɛ -G a 2 O 3 thin films: An electron paramagnetic resonance study. Physical Review Materials, 2019, 3 (8), pp.084601. ⟨10.1103/PhysRevMaterials.3.084601⟩. ⟨hal-03924960⟩
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Abdo Hassoun, Shahida Anusha Siddiqui, Slim Smaoui, İ̇lknur Ucak, Rai Naveed Arshad, et al.. Emerging Technological Advances in Improving the Safety of Muscle Foods: Framing in the Context of the Food Revolution 4.0. Food Reviews International, 2024, 40 (1), pp.37-78. ⟨10.1080/87559129.2022.2149776⟩. ⟨hal-04032389⟩
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Bingbing Xia, Jean-Jacques Ganem, Ian Vickridge, Emrick Briand, Sébastien Steydli, et al.. Water-rich conditions during titania atomic layer deposition in the 100 °C-300 °C temperature window produce films with TiIV oxidation state but large H and O content variations. Applied Surface Science, 2022, 601, pp.154233. ⟨10.1016/j.apsusc.2022.154233⟩. ⟨hal-03907172⟩
Dépôts en texte intégral
94
Mots clés
Oxidation
PIXE
Silica
Low energy electron diffraction LEED
15N
Sputtering
Isotopic Tracing
18O resonance
Topological insulators
Gallium oxide
Nickel
Rutherford backscattering spectrometry RBS
17O
Acoustic propreties of solid
8140Ef
Magnetic semiconductors
Ferromagnetic resonance
RBS
X-ray diffraction
Pulsed laser deposition
27Ald p&α
Alloys
Adsorption Isotherms
Ageing
GaMnAs
Epitaxy
Raman spectroscopy
Atomic Layer Deposition ALD
Defects
17Op
NRP
Topological defects
Silicon Carbide
27Alda
Hysteresis
XRD
2H
Silicon
Nanoparticles
ADSORPTION DESORPTION HYSTERESIS
Measurement
Magnetic anisotropy
27Aldp
Channeling
13C
HfO2
Growth
Ion beam analysis
Multilayer
Al2O3
Periodic multilayer
Gold
17Opp
Capillary condensation
Stable isotopic tracing
Diffusion
Indium oxide
Adsorbed layers
7550Pp
Zinc oxide
Adsorption
Transparent conductive oxide TCO
Pb centers
Alloy
Annealing
Kossel diffraction
Aluminum
Evaluation
Nuclear resonance profiling NRP
AFM
Acoustic
Energy loss
Photoluminescence
Magnetization curves
Thin films
18O
Auger electron spectroscopy AES
Charge exchange
Passivation
Nanostructures
7630Lh
Thin film
Aluminium
XPS
AC susceptibility
Metal-insulator transition
7550Ee
Epitaxial growth
Silicon carbide
Nitridation
SiC
Ion implantation
3C-SiC
Density functional theory
Oxygen deficiency
6855Jk
ALD
Interface defects
EPR
Nuclear reaction analysis